dc.contributor.author |
Bandara, AMRR |
|
dc.contributor.author |
Ranathunga, L |
|
dc.contributor.author |
Abdullah, NA |
|
dc.date.accessioned |
2014-06-18T15:27:37Z |
|
dc.date.available |
2014-06-18T15:27:37Z |
|
dc.date.issued |
2014-06-18 |
|
dc.identifier.uri |
http://dl.lib.mrt.ac.lk/handle/123/10036 |
|
dc.description.abstract |
Compacted Dither Pattern Code (CDPC) is a recently found feature which is successful in irregular shapes based visual depiction. Locally salient dither pattern feature is an attempt to expand the capability of CDPC for both regular and irregular shape based visual depiction. This paper presents an analysis of rotational and scale invariance property of locally salient dither pattern feature with a two dimensional spatial-chromatic histogram, which expands the applicability of the visual feature. Experiments were conducted to exhibit rotational and scale invariance of the feature. These experiments were conducted by combining linear Support Vector Machine (SVM) classifier to the new feature. The experimental results revealed that the locally salient dither pattern feature with the spatial-chromatic histogram is rotationally and scale invariant. |
en_US |
dc.language.iso |
en |
en_US |
dc.source.uri |
www.iciis.org |
en_US |
dc.subject |
Compacted Dither Pattern Codes |
|
dc.subject |
Content Based Retrieval |
|
dc.subject |
SVM |
|
dc.subject |
Salient Dither Pattern Feature |
|
dc.title |
Invariant properties of a locally salient dither pattern with a spatial-chromatic histogram |
en_US |
dc.type |
Conference-Abstract |
en_US |
dc.identifier.faculty |
Engineering |
en_US |
dc.identifier.department |
Department of Information Technology |
en_US |
dc.identifier.year |
2013 |
en_US |
dc.identifier.conference |
IEEE International Conference on Industrial and Information Systems [8th] - ICIIS 2013 |
en_US |
dc.identifier.place |
Peradeniya |
en_US |
dc.identifier.pgnos |
pp. 304-308 |
en_US |
dc.identifier.email |
lochandaka@uom.lk |
en_US |