dc.contributor.author |
Bandara, AMRR |
|
dc.date.accessioned |
2015-09-18T11:45:20Z |
|
dc.date.available |
2015-09-18T11:45:20Z |
|
dc.date.issued |
2015-09-18 |
|
dc.identifier.uri |
http://dl.lib.mrt.ac.lk/handle/123/11412 |
|
dc.description.abstract |
Compacted Dither Pattern Code (CDPC) is a
recently found feature which is successful in irregular shapes
based visual depiction. Locally salient dither pattern feature is
an attempt to expand the capability of CDPC for both regular
and irregular shape based visual depiction. This paper presents
an analysis of rotational and scale invariance property of locally
salient dither pattern feature with a two dimensional spatialchromatic
histogram, which expands the applicability of the
visual feature. Experiments were conducted to exhibit rotational
and scale invariance of the feature. These experiments were
conducted by combining linear Support Vector Machine (SVM)
classifier to the new feature. The experimental results revealed
that the locally salient dither pattern feature with the spatialchromatic
histogram is rotationally and scale invariant. |
en_US |
dc.language.iso |
en |
en_US |
dc.subject |
Index Terms— Compacted Dither Pattern Codes |
en_US |
dc.subject |
Content Based Retrieval |
|
dc.subject |
Salient Dither Pattern Feature |
|
dc.subject |
SVM |
|
dc.title |
Invariant properties of a locally salient dither pattern with a spatial-chromatic histogram |
en_US |
dc.type |
Conference-Abstract |
en_US |
dc.identifier.year |
2013 |
en_US |
dc.identifier.conference |
2013 IEEE 8th International Conference on Industrial and Information Systems, ICIIS 2013 |
en_US |
dc.identifier.pgnos |
1-5 |
en_US |
dc.identifier.email |
lochandaka@uom.lk |
en_US |