dc.contributor.author |
Attanayake, UB |
|
dc.contributor.author |
Aktan, HM |
|
dc.contributor.author |
Mejia, J |
|
dc.contributor.author |
Hay, R |
|
dc.date.accessioned |
2015-12-29T05:23:24Z |
|
dc.date.available |
2015-12-29T05:23:24Z |
|
dc.date.issued |
2015-12-29 |
|
dc.identifier.uri |
http://dl.lib.mrt.ac.lk/handle/123/11532 |
|
dc.description.abstract |
Abstract: Acoustic emission (AE) sensor technology is commonly used for real-time monitoring of fatigue sensitive
details. This is mainly due to its ability to detect fatigue events (crack initiation and opening) by mounting sensors
in the vicinity of potential crack location. Also, AE data can be used for damage location detection. Even though
AE provides many capabilities with regard to fatigue monitoring, many implementation challenges exist. A majority
of the challenges is associated with noise elimination, AE signal analysis, and interpretation of the results. This article
describes AE implementation for monitoring a fatigue-sensitive detail and use of data analysis techniques such as
cluster analysis, non-linear mapping (NLM), and three-class classifiers to identify the relationship of each cluster to
the characteristics of crack opening signals, background noise, and structural resonance. |
en_US |
dc.language.iso |
en |
en_US |
dc.subject |
Acoustic Emission |
en_US |
dc.subject |
Artificial Neural Network |
|
dc.subject |
Cluster Analysis |
|
dc.subject |
Data Analysis |
|
dc.subject |
Fatigue Monitoring |
|
dc.title |
Clustering Techniques and Artificial Neural Network for Acoustic Emission Data Analysis |
en_US |
dc.type |
Conference-Full-text |
en_US |
dc.identifier.faculty |
Engineering |
en_US |
dc.identifier.department |
Department of Engineering |
en_US |
dc.identifier.year |
2015 |
en_US |
dc.identifier.conference |
6th International Conference on Structural Engineering and Construction Management 2015 |
en_US |
dc.identifier.place |
Kandy, Sri Lanka |
en_US |
dc.identifier.pgnos |
7 |
en_US |
dc.identifier.email |
upul.attanayake@wmich.edu |
en_US |