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Data analysis and filter optimization for pulse-amplitude measurement: a case study on high-resolution x-ray spectroscopy

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dc.contributor.author Mannatunga, KS
dc.contributor.author Valinoti, B
dc.contributor.author Samayoa, WF
dc.contributor.author Crespo, ML
dc.contributor.author Cicuttin, A
dc.contributor.author Kamdem, JF
dc.contributor.author Garcia, LG
dc.contributor.author Carrato, S
dc.date.accessioned 2023-06-26T04:18:24Z
dc.date.available 2023-06-26T04:18:24Z
dc.date.issued 2022
dc.identifier.citation Mannatunga, K. S., Valinoti, B., Florian Samayoa, W., Crespo, M. L., Cicuttin, A., Folla Kamdem, J., Garcia, L. G., & Carrato, S. (2022). Data Analysis and Filter Optimization for Pulse-Amplitude Measurement: A Case Study on High-Resolution X-ray Spectroscopy. Sensors, 22(13), Article 13. https://doi.org/10.3390/s22134776 en_US
dc.identifier.issn 1424-8220 en_US
dc.identifier.uri http://dl.lib.uom.lk/handle/123/21158
dc.description.abstract In this study, we present a procedure to optimize a set of finite impulse response filter (FIR) coefficients for digital pulse-amplitude measurement. Such an optimized filter is designed using an adapted digital penalized least mean square (DPLMS) method. The effectiveness of the procedure is demonstrated using a dataset from a case study on high-resolution X-ray spectroscopy based on single-photon detection and energy measurements. The energy resolutions of the K𝛼 and K𝛽 lines of the Manganese energy spectrum have been improved by approximately 20% , compared to the reference values obtained by fitting individual photon pulses with the corresponding mathematical model. en_US
dc.language.iso en_US en_US
dc.publisher MDPI en_US
dc.subject digital signal processing (DSP) en_US
dc.subject digital pulse processor (DPP) en_US
dc.subject X-ray spectroscopy en_US
dc.subject silicon drift detectors en_US
dc.subject pulse-height analysis en_US
dc.subject FIR design en_US
dc.title Data analysis and filter optimization for pulse-amplitude measurement: a case study on high-resolution x-ray spectroscopy en_US
dc.type Article-Full-text en_US
dc.identifier.year 2022 en_US
dc.identifier.journal Sensors en_US
dc.identifier.issue 13 en_US
dc.identifier.volume 22 en_US
dc.identifier.pgnos 476[20p.] en_US
dc.identifier.doi https://doi.org/10.3390/s22134776 en_US


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