Macroeconomic credit risk model for the financial sector in Sri Lanka

dc.contributor.advisorDissanayake RA
dc.contributor.authorWickramasinghe DHI
dc.date.accept2019
dc.date.accessioned2019
dc.date.available2019
dc.date.issued2019
dc.description.abstractEconomic development has a direct bearing on the credit quality of financial institutions. This study attempts to recognize this association of macroeconomic determinants and credit risk in the Sri Lankan banking sector by way of a macroeconomic credit risk model. The study employs a Vector Error Correction Model (VECM) to capture the relationship between macroeconomic variables namely the Real Gross Domestic Product (GDP), Unemployment Rate and Real Effective Exchange Rate (REER) with Non-Performing Loans (NPL), the proxy for default rates. The study uses data on Sri Lankan banking sector from 2009 to 2018 for the purpose. As of the findings Unemployment rate and Exchange Rate are found to be significant determinants of NPL. Unemployment Rate and Exchange rate is observed to have a significant positive association with Non-performing loans. Additionally, NPL itself is shown to have a significant feedback effect on credit default.en_US
dc.identifier.accnoTH4074en_US
dc.identifier.citationWickramasinghe DHI (2019). Macroeconomic credit risk model for the financial sector in Sri Lanka [Master’s theses, University of Moratuwa]. Institutional Repository University of Moratuwa. http://dl.lib.mrt.ac.lk/handle/123/15990
dc.identifier.degreeMSc in Operational Researchen_US
dc.identifier.departmentDepartment of Mathematicsen_US
dc.identifier.facultyEngineeringen_US
dc.identifier.urihttp://dl.lib.mrt.ac.lk/handle/123/15990
dc.language.isoenen_US
dc.subjectMATHEMATICS-Dissertationsen_US
dc.subjectOPERATIONAL RESEARCH-Dissertationsen_US
dc.subjectCREDIT RISK MODELLINGen_US
dc.subjectBANKS AND BANKING-Non-Performing Loansen_US
dc.subjectVECTOR ERROR CORRECTION MODELen_US
dc.titleMacroeconomic credit risk model for the financial sector in Sri Lankaen_US
dc.typeThesis-Full-texten_US

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