Detection of defects on warp-knit fabric surfaces using self organizing map

dc.contributor.authorWijesingha, D
dc.contributor.authorJayasekara, B
dc.contributor.editorChathuranga, D
dc.date.accessioned2022-08-16T03:21:06Z
dc.date.available2022-08-16T03:21:06Z
dc.date.issued2018-05
dc.description.abstractWarp-knit fabric surface is a patterned textured surface with repetitive units on its surface. Only few researches have been reported for detection of defects on patterned fabric surfaces. In this paper, an anomaly detection method based on self organizing map is proposed for detecting defects on warpknit surfaces. The method consists of self organizing maps on two levels. The method was applied to a set of images of 8 different types of warp-knit surfaces, which included samples from the 8 categories of defects. According to the experimental results, defect detection rates of proposed method are close to 80 percent in most categories of defects.en_US
dc.identifier.citationD. Wijesingha and B. Jayasekara, "Detection of Defects on Warp-knit Fabric Surfaces Using Self Organizing Map," 2018 Moratuwa Engineering Research Conference (MERCon), 2018, pp. 601-606, doi: 10.1109/MERCon.2018.8421944.en_US
dc.identifier.conference2018 Moratuwa Engineering Research Conference (MERCon)en_US
dc.identifier.departmentEngineering Research Unit, University of Moratuwaen_US
dc.identifier.doi10.1109/MERCon.2018.8421944en_US
dc.identifier.emailbuddhikaj@uom.lken_US
dc.identifier.facultyEngineeringen_US
dc.identifier.pgnospp. 601-606en_US
dc.identifier.placeMoratuwa, Sri Lankaen_US
dc.identifier.proceedingProceedings of 2018 Moratuwa Engineering Research Conference (MERCon)en_US
dc.identifier.urihttp://dl.lib.uom.lk/handle/123/18634
dc.identifier.year2018en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.relation.urihttps://ieeexplore.ieee.org/document/8421944en_US
dc.subjectSelf organizing mapen_US
dc.subjecttexture clasificationen_US
dc.subjectdefect detectionen_US
dc.titleDetection of defects on warp-knit fabric surfaces using self organizing mapen_US
dc.typeConference-Full-texten_US

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